Characterization
Device performance over voltage and temperature is gathered on the test equipment and loaded into the TestEdge database. This information is analyzed and a detailed characterization report is generated. This report will show how the device performs over temperature, voltage, and process corners. This information will be used to determine the production test limits and is often used in device specifications.
shim.gif boxplot_dynidd.gif




Home   |   Test Engineering   |   ATE Platforms Used   |   Characterization   |   Wafer Sort   |   Production Support
Custom Bench Test   |   Fixture Design   |   Packaging Assistance   |   White Papers   |   Technical Notes
About TestEdge   |   Contact Us   |   Map & Directions   |   Careers   |   Industry Partners
© 2017 TestEdge, Inc.